全偏極化微波散射儀-天線設計與系統校準; A Fully Polarimetric Microwave Scatterometer-Antenna Design and System Calibration

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題名:	全偏極化微波散射儀-天線設計與系統校準;A Fully Polarimetric Microwave Scatterometer-Antenna Design and System Calibration
作者:	王俊卿;Jung-Qin Wang
貢獻者:	電機工程研究所
關鍵詞:	向量網路分析儀;散射儀;等邊金字塔型號角天線;VNA;beamwidth;RCS;OMT;scatterometer
日期:	2001-06-08
上傳時間:	2009-09-22 11:42:42 (UTC+8)
出版者:	國立中央大學圖書館
摘要:	在這篇論文裡，主要討論的是 X頻帶、全偏極化散射儀，重點是放在天線設計與系統校準。由於對不同偏極化通道間高隔離度嚴格要求，在此設計、製作了雙偏極化金字塔型號角天線；複習了關於號角天線理論的書籍，並經由量測將天線的增益與主波束頻寬等特性找出，測量的結果與數值模擬的結果相吻合。在此也提出了一套系統校準方式：利用一個金屬球來當作校準物，以得到不同通道間的互擾因子效應。實驗證明當網路分析儀在低雜訊水準的條件下，距離6 m可以測量低到—56 dBsm的雷達截面積。 In this thesis, the antenna design and system calibration of an X-band fully polarimetric scatterometer are presented. Due to the strict demand of high isolation between channels of different polarizations, a dual-polarized pyramidal horn is designed and implemented. The theory regarding to the horn antenna in the literature is reviewed, and the antenna measurements are performed in order to characterize both gain and beamwidth. The measurement results are in good agreement with numerical simulation. The system calibration procedure is also given and demonstrated. A metallic sphere is used as a standard target to obtain the value of crosstalk effect between different channels. Experiments show that with a network analyzer of low noise level, the radar cross section can be measured to the value as low as -56 dBsm.
顯示於類別:	[電機工程研究所] 博碩士論文

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