摘要 在此論文中，我們提出一個新的方法來量測高速電路。我們的量測方法分為兩部分。第一部分為eye diagram的量測方法，我們可由此方法得知待測信號的大小、雜訊大小、以及抖動(jitter)大小。第二部分為eye mask的量測方法，藉由此方法，我們可得到待測信號的大小和BER。然後，我們可判斷出待測訊號是否能夠通過eye mask的測試。 除了理論的推導外，我們將會利用軟體模擬來驗證我們所提出的方法，並實際以硬體實現來驗證此方法的可行性。我們利用三種不同的方法產生欲輸入的待測信號，第一個訊號是利用MATLAB產生的Gaussian noise。第二個訊號是LFSR產生，再經過USB2.0的版子所得的輸入訊號。最後一個訊號則是由logic analyzer產生的random noise。由我們的量測結果中，我們可證明此方法的正確性。 Abstract In this thesis, we proposed a novel methodology to test high speed circuit. We divide our testing methodology into two parts. The first one is the eye diagram testing methodology. We can obtain the signal mean, signal noise, and jitter from eye diagram testing. The second part is the eye mask testing methodology. By this methodology, we can obtain the signal noise and BER of the DUT. Then we can determine if the signals pass the eye mask test or not. In additional to the theory derivation, we will verify the methodology by software simulation and hardware emulation to assure the feasibility. The input signals are generated by three methods. The first signals are generated by MATLAB program with Gaussian noise. The second emulated signals are generated from LFSR and pass through USB2.0 board. The last emulated signals are generated by logic analyzer with random noise. The test results show the correctness of our probability deviation and verify that out methodology can work.
