Testing Random Defect and Process Variation Induced Comparison Faults of TCAMs with Asymmetric Cells

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Title:	Testing Random Defect and Process Variation Induced Comparison Faults of TCAMs with Asymmetric Cells
Authors:	Li,JF;Huang,YJ;Hu,YJ
Contributors:	電機工程學系
Keywords:	MEMORIES
Date:	2010
Issue Date:	2012-03-28 10:12:57 (UTC+8)
Publisher:	國立中央大學
Abstract:	This paper presents a march-like test T(AC-P) to cover comparison faults of ternary content addressable memories (TCAMs) with asymmetric cells. The T(AC-P) only requires 4N Write operations and (3N + 2B) Compare operations for an N x B-bit TCAM with Hit and priority address encoder outputs. We show that the test also can cover search time failures induced by process variation in the comparison circuit of a TCAM. Furthermore, a test T(MF) for match failures induced by the process variation in the comparison circuit of a TCAM is also presented.
Relation:	IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
Appears in Collections:	[Department of Electrical Engineering] journal & Dissertation

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