English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 81570/81570 (100%)
造访人次 : 47453424      在线人数 : 459
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜寻范围 查询小技巧：
  • 您可在西文检索词汇前后加上"双引号"，以获取较精准的检索结果
  • 若欲以作者姓名搜寻，建议至进阶搜寻限定作者字段，可获得较完整数据
    •  进阶搜寻

    类别浏览

    正在载入社群分类, 请稍候....

    年代浏览

    正在载入年代分类, 请稍候....

    "Li,JF"的相关文件  

    回到依作者浏览

    显示 16 项.

    类别 日期 题名 作者 档案
    [電機工程學系] 期刊論文 2011 A Low-Cost Built-In Redundancy-Analysis Scheme for Word-Oriented RAMs With 2-D Redundancy Tseng,TW; Li,JF
    [電機工程學系] 期刊論文 2011 Memory Built-In Self-Repair Planning Framework for RAMs in SoCs Hou,CS; Li,JF; Tseng,TW
    [電機工程學系] 期刊論文 2011 SETBIST: An Soft-Error Tolerant Built-In Self-Test Scheme for Random Access Memories Tseng,TW; Li,JF
    [電機工程學系] 期刊論文 2010 A Built-in Method to Repair SoC RAMs in Parallel Tseng,TW; Li,JF; Hou,CS
    [電機工程學系] 期刊論文 2010 DABISR: A Defect-Aware Built-In Self-Repair Scheme for Single/Multi-Port RAMs in SoCs Tseng,TW; Huang,YJ; Li,JF
    [電機工程學系] 期刊論文 2010 ReBISR: A Reconfigurable Built-In Self-Repair Scheme for Random Access Memories in SOCs Tseng,TW; Li,JF; Hsu,CC
    [電機工程學系] 期刊論文 2010 Reliability-Enhancement and Self-Repair Schemes for SRAMs With Static and Dynamic Faults Li,JF; Tseng,TW; Hou,CS
    [電機工程學系] 期刊論文 2010 Testing Comparison and Delay Faults of TCAMs With Asymmetric Cells Li,JF
    [電機工程學系] 期刊論文 2010 Testing Random Defect and Process Variation Induced Comparison Faults of TCAMs with Asymmetric Cells Li,JF; Huang,YJ; Hu,YJ
    [電機工程研究所] 期刊論文 2005 A built-in self-repair design for RAMs with 2-D redundancy Li,JF; Yeh,JC; Huang,RF; Wu,CW
    [電機工程研究所] 期刊論文 2004 Diagnosing binary content addressable memories with comparison and RAM faults Li,JF
    [電機工程研究所] 期刊論文 2004 Efficient block-level connectivity verification algorithms for embedded memories Li,JF
    [電機工程研究所] 期刊論文 2003 Built-in redundancy analysis for memory yield improvement Huang,CT; Wu,CF; Li,JF; Wu,CW
    [電機工程研究所] 期刊論文 2003 Testing and diagnosis methodologies for embedded content addressable memories Li,JF; Tzeng,RS; Wu,CW
    [電機工程研究所] 期刊論文 2002 A hierarchical test methodology for systems on chip Li,JF; Huang,HJ; Chen,JB; Su,CP; Wu,CW; Cheng,C; Chen,SI; Hwang,CY; Lin,HP
    [土木工程研究所] 期刊論文 2004 Evaluation of asymptotic stress field around a crack tip for Neo-Hookean hyperelastic materials Chang,JH; Li,JF

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期：8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 隱私權政策聲明