English  |  正體中文  |  简体中文  |  Items with full text/Total items : 70585/70585 (100%)
Visitors : 23109690      Online Users : 390
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/51926


    Title: DABISR: A Defect-Aware Built-In Self-Repair Scheme for Single/Multi-Port RAMs in SoCs
    Authors: Tseng,TW;Huang,YJ;Li,JF
    Contributors: 電機工程學系
    Keywords: REDUNDANCY ANALYSIS;INFRASTRUCTURE IP;EMBEDDED MEMORIES;2-D REDUNDANCY;YIELD
    Date: 2010
    Issue Date: 2012-03-28 10:10:37 (UTC+8)
    Publisher: 國立中央大學
    Abstract: Built-in self-repair (BISR) techniques are widely used to enhance the yield of embedded random access memories (RAMs). Fault-location ability of test algorithms executed by a BISR circuit has heavy impact on the repair efficiency of the BISR circuit. This paper proposes a defect-aware BISR (DABISR) scheme for single-port RAMs (SPRAMs) and multiport RAMs (MPRAMs) in system chips. Multiple RAMs can share a DABISR such that the area cost of DABISR is drastically reduced. We also present two defect-location algorithms (DLAs) for identification of bridge defects between word-lines and bit-lines of MPRAMs. The DABISR can perform DLAs to locate bridge defects such that it can provide high repair efficiency. For example, simulation results show that if a faulty two-port RAM has 20% inter-port faults, the DLAs can help to gain 8.4-14.4% increase of repair rate for different redundancy configurations. In comparison with an existing shared BISR scheme, however, the DABISR only incurs about 0.34% additional area overhead to support the function of DLAs.
    Relation: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
    Appears in Collections:[電機工程學系] 期刊論文

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML255View/Open


    All items in NCUIR are protected by copyright, with all rights reserved.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback  - 隱私權政策聲明