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https://ir.lib.ncu.edu.tw/handle/987654321/100577
题名:
Uniform SiGe/Si quantum well nanorod and nanodot arrays fabricated using nanosphere lithography
作者:
鄭紹良
;
Chang, Hung-Tai
;
Wu, Bo-Lun
;
Cheng, Shao-Liang
;
Lee, Tu
;
Lee, Sheng-Wei
贡献者:
工學院化學工程與材料工程學系
关键词:
Chemistry and Materials Science
;
Lithography
;
Materials Science
;
Molecular Medicine
;
Nano Express
;
Nanochemistry
;
Nanoscale Science and Technology
;
Nanotechnology
;
Nanotechnology and Microengineering
日期:
2013-01-01
上传时间:
2026-04-21 14:07:13 (UTC+8)
出版者:
Springer New York;New York: Springer New York
摘要:
摘要: This study fabricates the optically active uniform SiGe/Si multiple quantum well (MQW) nanorod and nanodot arrays from the Si 0.4 Ge 0.6 /Si MQWs using nanosphere lithography (NSL) combined with the reactive ion etching (RIE) process. Compared to the as-grown sample, we observe an obvious blueshift in photoluminescence (PL) spectra for the SiGe/Si MQW nanorod and nanodot arrays, which can be attributed to the transition of PL emission from the upper multiple quantum dot-like SiGe layers to the lower MQWs. A possible mechanism associated with carrier localization is also proposed for the PL enhancement. In addition, the SiGe/Si MQW nanorod arrays are shown to exhibit excellent antireflective characteristics over a wide wavelength range. These results indicate that SiGe/Si MQW nanorod arrays fabricated using NSL combined with RIE would be potentially useful as an optoelectronic material operating in the telecommunication range.
其他題名: Nanoscale Res Lett
出版者: New York: Springer New York
出版日期: 2013-08-08
出處: Nanoscale research letters, 2013-08, Vol.8 (1), p.349-349, Article 349
資源來源: Springer Nature Link (Free)
版權: Chang et al.; licensee Springer. 2013. This article is published under license to BioMed Central Ltd. This is an Open Access article distributed under the terms of the Creative Commons Attribution License ( ), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
版權: The Author(s) 2013
版權: Copyright ©2013 Chang et al.; licensee Springer. 2013 Chang et al.; licensee Springer.
識別號: ISSN: 1556-276X
識別號: ISSN: 1931-7573
識別號: EISSN: 1556-276X
識別號: DOI: 10.1186/1556-276X-8-349
識別號: PMID: 23924368
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[化學工程與材料工程學系 ] 期刊論文
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