摘要： This paper discusses how the microstructures of Sn films affect the kinetics of spontaneous Sn whisker growth. Thin films and those with small grains grew longer whiskers at higher rates than did thick films and those with large grains. Biaxial stresses in the films were measured using synchrotron radiation X-ray; the stress evolution during annealing was correlated with the growth kinetics. An incubation period was observed, in which the compressive stresses in the films built up and the whiskers nucleated. The results indicate that thickness has a greater effect on whisker growth than grain size has. 其他題名： J Mater Sci 出版者： New York: Springer US 出版日期： 2016-04-01 出處： Journal of materials science, 2016-04, Vol.51 (7), p.3600-3606 資源來源： EBSCOhost OmniFile Full Text Select 版權： Springer Science+Business Media New York 2015 版權： COPYRIGHT 2016 Springer 版權： Journal of Materials Science is a copyright of Springer, (2015). All Rights Reserved. 識別號： ISSN: 0022-2461 識別號： EISSN: 1573-4803 識別號： DOI: 10.1007/s10853-015-9680-y
