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    Please use this identifier to cite or link to this item: https://ir.lib.ncu.edu.tw/handle/987654321/102965


    Title: Crystalline silicon interface passivation improvement with a-Si 1-xCx:H and its application in hetero-junction solar cells with intrinsic layer
    Authors: 李建階;Chang, Teng-Hsiang;Chu, Yen-Ho;Lee, Chien-Chieh;Chang, Jenq-Yang
    Contributors: 光電科學研究中心
    Keywords: Conversion;Crystal structure;Deposition;Passivation;Photovoltaic cells;Silicon;Silicon carbide;Solar cells
    Date: 2012-12-10
    Issue Date: 2026-04-23 11:21:09 (UTC+8)
    Abstract: 摘要: Excellent passivation of an n-type Czochralski crystalline silicon surface is made possible by the deposition of hydrogenated silicon carbide (Si1−xCx:H) layers in the electron cyclotron resonance chemical vapor deposition. We investigate the structural effect with various CH4/SiH4 dilution ratios, and the lowest effective surface recombination velocity (21.03 cm/s) that can be obtained. We also demonstrate that the Voc can be improved more than 200 mV by inserting Si1−xCx:H layers to form hetero-junction with intrinsic thin layer (HIT) solar cells. The conversion efficiency of the planar HIT solar cell with μc-Si emitter can reach 13%.
    出版日期: 2012-12-10
    出處: Applied physics letters, 2012-12, Vol.101 (24)
    資源來源: AIP Journals (American Institute of Physics)
    識別號: ISSN: 0003-6951
    識別號: EISSN: 1077-3118
    識別號: DOI: 10.1063/1.4770308
    Appears in Collections:[Optical Sciences Center] journal & Dissertation

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