English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 94201/94201 (100%)
造訪人次 : 81507085      線上人數 : 2791
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋


    請使用永久網址來引用或連結此文件: https://ir.lib.ncu.edu.tw/handle/987654321/106969


    題名: Design of an error detection and data recovery architecture for motion estimation testing applications
    作者: 許鈞瓏;Cheng, Chang-Hsin;Liu, Yu;Hsu, Chun-Lung
    貢獻者: 資訊電機學院電機工程學系
    關鍵詞: Acceptability;Applied sciences;Area overhead;Circuit faults;Circuit properties;Circuit synthesis;Coding;Computer architecture;Data recovery;Design engineering;Design. Technologies. Operation analysis. Testing;Electric, optical and optoelectronic circuits;Electronic circuits;Electronics;Error detection;Exact sciences and technology;Focusing;Integrated circuit modeling;Integrated circuits;Integrated circuits by function (including memories and processors);Mathematical model;motion estimation;Pixel;reliability;residue-and-quotient (RQ) code;Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices;Signal convertors;Testing;Time measurements;Very large scale integration
    日期: 2012-04-01
    上傳時間: 2026-04-23 13:50:48 (UTC+8)
    出版者: Institute of Electrical and Electronics Engineers Inc.;New York, NY: IEEE
    摘要: 摘要: Given the critical role of motion estimation (ME) in a video coder, testing such a module is of priority concern. While focusing on the testing of ME in a video coding system, this work presents an error detection and data recovery (EDDR) design, based on the residue-and-quotient (RQ) code, to embed into ME for video coding testing applications. An error in processing elements (PEs), i.e. key components of a ME, can be detected and recovered effectively by using the proposed EDDR design. Experimental results indicate that the proposed EDDR design for ME testing can detect errors and recover data with an acceptable area overhead and timing penalty. Importantly, the proposed EDDR design performs satisfactorily in terms of throughput and reliability for ME testing applications.
    其他題名: TVLSI
    出版者: New York, NY: IEEE
    出版日期: 2012-04-01
    出處: IEEE transactions on very large scale integration (VLSI) systems, 2012-04, Vol.20 (4), p.665-672
    資源來源: IEEE Electronic Library (IEL)
    版權: 2015 INIST-CNRS
    版權: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Apr 2012
    識別號: ISSN: 1063-8210
    識別號: EISSN: 1557-9999
    識別號: DOI: 10.1109/TVLSI.2011.2109972
    識別號: CODEN: IEVSE9
    顯示於類別:[電機工程學系] 期刊論文

    文件中的檔案:

    檔案 描述 大小格式瀏覽次數
    index.html0KbHTML13檢視/開啟


    在NCUIR中所有的資料項目都受到原著作權保護.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 隱私權政策聲明