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    請使用永久網址來引用或連結此文件: https://ir.lib.ncu.edu.tw/handle/987654321/107197


    題名: Evaluation of sub-0.2 V high-speed low-power circuits using hetero-channel MOSFET and tunneling FET devices
    作者: 胡璧合;Chen, Yin-Nien;Fan, Ming-Long;Hu, Vita Pi-Ho;Su, Pin;Chuang, Ching-Te
    貢獻者: 資訊電機學院電機工程學系
    關鍵詞: Capacitance;Circuits;Delay;Delays;Design engineering;Devices;Dynamics;Hetero-channel MOSFET;High speed;Inverters;Leakage currents;Logic gates;low-power;MOSFET;MOSFETs;tunnel FET;Tunneling
    日期: 2014-01-01
    上傳時間: 2026-04-23 13:59:40 (UTC+8)
    出版者: Institute of Electrical and Electronics Engineers Inc.;New York: IEEE
    摘要: 摘要: This paper investigates the feasibility of sub-0.2 V high-speed low-power circuits with hetero-channel MOSFET and emerging Tunneling FET (TFET) devices. First, the device designs and characteristics of hetero-channel MOSFET and TFET devices are discussed and compared. Due to the significant leakage current of ultra-low VT hetero-channel MOSFET devices, assist-circuits are required for hetero-channel MOSFET-based circuits to operate at 0.2 V. Second, the delay, dynamic energy and the Standby power of hetero-channel TFET-based and MOSFET-based logic circuits including Inverter, NAND, BUS Driver, and Latch are analyzed and evaluated. The results indicate that hetero-channel TFET-based circuits with Dual Oxide (DOX) device design to reduce the Miller capacitance provide the potential to achieve high-speed low-power operation at VDD=0.2 V, while the use of assist-circuits in MOSFET-based design improves the delay and dynamic energy at the expense of increased device count, circuit area, and large Standby and sleep-mode leakage power. Finally, the impacts of temperature and process variations on TFET-based and MOSFET-based logic circuits are discussed.
    其他題名: TCSI
    出版者: New York: IEEE
    出版日期: 2014-12-01
    出處: IEEE transactions on circuits and systems. I, Regular papers, 2014-12, Vol.61 (12), p.3339-3347
    資源來源: IEEE Electronic Library (IEL)
    版權: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Dec 2014
    識別號: ISSN: 1549-8328
    識別號: EISSN: 1558-0806
    識別號: DOI: 10.1109/TCSI.2014.2335032
    識別號: CODEN: ITCSCH
    顯示於類別:[電機工程學系] 期刊論文

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