Institute of Electrical and Electronics Engineers Inc.;New York, NY: IEEE
摘要:
摘要： This paper proposes an enhanced IEEE 1500 test wrapper to support the testing and diagnosis of the single-port or multi-port RAM core attached to the enhanced IEEE 1500 test wrapper without incurring large area overhead to small memories. Effective test time reduction techniques for the proposed test scheme are also proposed. Simulation results show that the additional area cost for implementing the enhanced IEEE 1500 test wrapper is only about 0.58% for a 64 K-bit single-port RAM and only 0.57% for a 64 K-bit two-port RAM in 90-nm technology. 其他題名： TVLSI 出版者： New York, NY: IEEE 出版日期： 2012-11-01 出處： IEEE transactions on very large scale integration (VLSI) systems, 2012-11, Vol.20 (11), p.2123-2127 資源來源： IEEE Electronic Library (IEL) 版權： 2015 INIST-CNRS 版權： Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Nov 2012 識別號： ISSN: 1063-8210 識別號： EISSN: 1557-9999 識別號： DOI: 10.1109/TVLSI.2011.2165568 識別號： CODEN: IEVSE9
