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    題名: Significant mobility enhancement in extremely thin highly doped ZnO films
    作者: 姚毓峰;Look, David C.;Heller, Eric R.;Yao, Yu-Feng;Yang, C. C.
    貢獻者: 資訊電機學院電機工程學系
    關鍵詞: Applied physics;Buffer layers;BUFFERS;CARRIER MOBILITY;CONCENTRATION RATIO;CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;DEBYE LENGTH;DOPED MATERIALS;Epitaxial growth;FERMI LEVEL;GALLIUM COMPOUNDS;HALL EFFECT;INTERFACES;LAYERS;MOBILITY;MOLECULAR BEAM EPITAXY;SCATTERING;THIN FILMS;Zinc oxide;ZINC OXIDES
    日期: 2015-04-13
    上傳時間: 2026-04-23 14:39:22 (UTC+8)
    出版者: American Institute of Physics;Melville: American Institute of Physics
    摘要: 摘要: Highly Ga-doped ZnO (GZO) films of thicknesses d = 5, 25, 50, and 300 nm, grown on 160-nm ZnO buffer layers by molecular beam epitaxy, had 294-K Hall-effect mobilities μH of 64.1, 43.4, 37.0, and 34.2 cm2/V-s, respectively. This extremely unusual ordering of μH vs d is explained by the existence of a very high-mobility Debye tail in the ZnO, arising from the large Fermi-level mismatch between the GZO and the ZnO. Scattering theory in conjunction with Poisson analysis predicts a Debye-tail mobility of 206 cm2/V-s at the interface (z = d), falling to 58 cm2/V-s at z = d + 2 nm. Excellent fits to μH vs d and sheet concentration ns vs d are obtained with no adjustable parameters.
    出版者: Melville: American Institute of Physics
    出版日期: 2015-04-13
    出處: Applied physics letters, 2015-04, Vol.106 (15)
    資源來源: AIP Publishing
    版權: 2015 AIP Publishing LLC.
    識別號: ISSN: 0003-6951
    識別號: ISSN: 1520-8842
    識別號: ISSN: 1077-3118
    識別號: EISSN: 1077-3118
    識別號: DOI: 10.1063/1.4917561
    顯示於類別:[電機工程學系] 期刊論文

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