摘要： Ternary content addressable memory (TCAM) is a key component in various digital systems due to its fast lookup operation. Symmetric and asymmetric TCAM cells are two widely used cells for implementing a TCAM array. This paper presents several comparison fault models of TCAMs with asymmetric cells based on electrical defects. Some new comparison faults which do not exist in a TCAM with symmetric cells are found. One march-like test algorithm T AC-H is also proposed to cover the defined comparison faults. The T AC-H consists of 8N Write operations and (3N + 2B) Compare operations for an N × B-bit TCAM with Hit output only. We also propose two march-like diagnosis algorithms to identify the defined comparison faults of TCAMs with asymmetric cells. The first diagnosis algorithm D AC-H requires 5N Write operations, 3N Erase operations, and (5N + 2B) Compare operations to distinguish 100 percent comparison faults for a TCAM with Hit output only. The second diagnosis algorithm D AC-P requires 3N Write operations, 1N Erase operations, and (5N + 2B) Compare operations to distinguish 100 percent comparison faults for a TCAM with Hit and priority address encoder outputs. 其他題名： TC 出版者： New York: IEEE 出版日期： 2012-11-01 出處： IEEE transactions on computers, 2012-11, Vol.61 (11), p.1576-1587 資源來源： IEEE Electronic Library (IEL) 版權： Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Nov 2012 識別號： ISSN: 0018-9340 識別號： EISSN: 1557-9956 識別號： DOI: 10.1109/TC.2011.196 識別號： CODEN: ITCOB4
