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| 題名: | Block copolymer alignment method for mobility anisotropy and enhancement of poly(3-hexylthiophene) thin-film transistors |
| 作者: | 何正榮;Cheng, J.-W. John;Ho, Jeng-Rong;Tseng, Yu-Wei;Su, Hung-Jie;Chien, Chi-Horng;Tsiang, Raymond C.-C.;Hsu, Chia Chen;Chen, Ting-Ray;Chiang, Cheng-Yi |
| 貢獻者: | 工學院機械工程學系 |
| 關鍵詞: | Anisotropy;Annealing;Applied sciences;Block copolymers;Copolymers;Exact sciences and technology;Identification and classification;Materials;Morphology;Physicochemistry of polymers;Polymer industry, paints, wood;Production processes;Properties;Scanning electron microscopy;Technology of polymers;Thin film devices;Thin films;Transistors |
| 日期: | 2012-12-01 |
| 上傳時間: | 2026-04-23 14:47:20 (UTC+8) |
| 出版者: | John Wiley and Sons Inc.;Hoboken: Wiley Subscription Services, Inc., A Wiley Company |
| 摘要: | 摘要： In this article, a new alignment‐layer approach based on block copolymers (BCPs) is proposed for mobility anisotropy and enhancement of organic thin‐film transistors (OTFTs). In particular, the poly(3‐hexylthiophene) (P3HT) TFT with polystyrene‐block‐poly(methyl methacrylate) alignment layer was studied. With max dichroic ratio 1.23 in polarized absorption spectra of P3HT and corresponding device mobility anisotropy 4.63, taking place at the highest annealing temperature of 230°C, the BCP alignment approach proved to be an effective tool for orientation control of polymers such as the P3HT. However, because of negative effect of thermal annealing that causes twisting in P3HT backbones, the achieved mobility enhancement was only a meager 41%. Nevertheless, with rich varieties in the composition and complexity of BCPs, the proposed BCP alignment design represents an interesting alternative to existing alignment approaches to orientation control of P3HT and mobility anisotropy and enhancement of the resultant OTFTs. Besides, the phase‐alternate surface morphology of the BCP alignment layer was confirmed through a series of atomic force microscopy, X‐ray photoelectron microscopy, and field‐emission scanning electron microscopy. POLYM. ENG. SCI., 2012. © 2012 Society of Plastics Engineers
其他題名： Polym Eng Sci
出版者： Hoboken: Wiley Subscription Services, Inc., A Wiley Company
出版日期： 2012-12
出處： Polymer engineering and science, 2012-12, Vol.52 (12), p.2581-2587
資源來源： Wiley Online Library Journals
版權： Copyright © 2012 Society of Plastics Engineers
版權： 2014 INIST-CNRS
版權： COPYRIGHT 2012 Society of Plastics Engineers, Inc.
版權： Copyright Blackwell Publishing Ltd. Dec 2012
識別號： ISSN: 0032-3888
識別號： EISSN: 1548-2634
識別號： DOI: 10.1002/pen.23220
識別號： CODEN: PYESAZ |
| 顯示於類別: | [機械工程學系] 期刊論文
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