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請使用永久網址來引用或連結此文件:
https://ir.lib.ncu.edu.tw/handle/987654321/108431
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| 題名: | Thermally induced variations of strain condition and emission behavior in flat and bendable lightemitting diodes on different substrates |
| 作者: | 姚毓峰;Lin, Chun-Han;Su, Chia-Ying;Zhu, Erwin;Hsieh, Chieh;Tu, Charng-Gan;Yao, Yu-Feng;Chen, Hao-Tsung;Liao, Che-Hao;Chen, Horng-Shyang;Kiang, Yean-Woei;Yang, C. C. |
| 貢獻者: | 資訊電機學院電機工程學系 |
| 日期: | 2015-06-15 |
| 上傳時間: | 2026-04-23 14:48:13 (UTC+8) |
| 出版者: | The Optical Society;United States |
| 摘要: | 摘要: The emission behaviors of four light-emitting diodes (LEDs) of different substrate structures, including a lateral LED grown on sapphire, a vertical LED wafer-bonded onto Si (111), a bendable LED Ag-epoxied onto a flat metal, and another bendable LED Ag-epoxied onto a metal of a curved surface, under different duty cycles of current injection are compared. Their different variation trends of emission behavior with injection duty cycle are attributed to the different thermally-induced strain conditions in the epitaxial layers, which are controlled by their substrate structures, in increasing injection duty cycle or current level. The results of Raman scattering measurements during LED operation show that a stronger tensile strain is generated under heating for reducing the quantum-confined Stark effect and hence increasing emission efficiency when the epitaxial layer is not tightly bonded onto a hard substrate. Such a behavior is particularly stronger when the epitaxial layer is bent. 其他題名: Opt Express 出版者: United States 出版日期: 2015-06-15 出處: Optics express, 2015-06, Vol.23 (12), p.15491 資源來源: Optica Publishing Group Journals 識別號: ISSN: 1094-4087 識別號: EISSN: 1094-4087 識別號: DOI: 10.1364/OE.23.015491 識別號: PMID: 26193529 |
| 顯示於類別: | [電機工程學系] 期刊論文
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