English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 94201/94201 (100%)
造訪人次 : 81557985      線上人數 : 3736
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋


    請使用永久網址來引用或連結此文件: https://ir.lib.ncu.edu.tw/handle/987654321/108532


    題名: Void structures in regularly patterned Zno nanorods grown with the hydrothermal method
    作者: 姚毓峰;Kiang, Yean-Woei;Yang, C. C.;Chang, Wen-Ming;Chen, Horng-Shyang;Su, Chia-Ying;Chou, Wang-Hsien;Shih, Pei-Ying;Chen, Wei-Fang;Shen, Chen-Hung;Yao, Yu-Feng;Liao, Che-Hao
    貢獻者: 資訊電機學院電機工程學系
    關鍵詞: Annealing;Aqueous solutions;Arrays;Chemical vapor deposition;Emission spectroscopy;Hydroxyl groups;Nanomaterials;Photovoltaic cells;Radioactivity;Solar energy;Thin films;Vacancies;Voids;Zinc oxide
    日期: 2014-01-01
    上傳時間: 2026-04-23 14:54:00 (UTC+8)
    出版者: Hindawi Publishing Corporation;Cairo, Egypt: Hindawi Limiteds
    摘要: 摘要: The void structures and related optical properties after thermal annealing with ambient oxygen in regularly patterned ZnO nanrorod (NR) arrays grown with the hydrothermal method are studied. In increasing the thermal annealing temperature, void distribution starts from the bottom and extends to the top of an NR in the vertical (c-axis) growth region. When the annealing temperature is higher than 400°C, void distribution spreads into the lateral (m-axis) growth region. Photoluminescence measurement shows that the ZnO band-edge emission, in contrast to defect emission in the yellow-red range, is the strongest under the n-ZnO NR process conditions of 0.003 M in Ga-doping concentration and 300°C in thermal annealing temperature with ambient oxygen. Energy dispersive X-ray spectroscopy data indicate that the concentration of hydroxyl groups in the vertical growth region is significantly higher than that in the lateral growth region. During thermal annealing, hydroxyl groups are desorbed from the NR leaving anion vacancies for reacting with cation vacancies to form voids.
    出版者: Cairo, Egypt: Hindawi Limiteds
    出版日期: 2014-01-01
    出處: Journal of Nanomaterials, 2014-01, Vol.2014 (2014), p.305-315-437
    資源來源: Chinese Electronic Periodical Services (CEPS)_2025
    版權: Copyright © 2014 Yu-Feng Yao et al.
    版權: Copyright © 2014 Yu-Feng Yao et al. Yu-Feng Yao et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
    識別號: ISSN: 1687-4110
    識別號: ISSN: 1687-4129
    識別號: EISSN: 1687-4129
    識別號: DOI: 10.1155/2014/756401
    顯示於類別:[電機工程學系] 期刊論文

    文件中的檔案:

    檔案 描述 大小格式瀏覽次數
    index.html0KbHTML16檢視/開啟


    在NCUIR中所有的資料項目都受到原著作權保護.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 隱私權政策聲明