English  |  正體中文  |  简体中文  |  Items with full text/Total items : 70585/70585 (100%)
Visitors : 23124142      Online Users : 418
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version

    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/29306

    Title: High thermal conductive passivation films on AlGaAs/GaAs heterojunction diodes and bipolar transistors
    Authors: Hwang,HP;Cheng,YS;Shieh,JL;Pan,JW;Chyi,JI
    Contributors: 電機工程研究所
    Keywords: SURFACE
    Date: 1997
    Issue Date: 2010-06-29 20:21:23 (UTC+8)
    Publisher: 中央大學
    Abstract: The de characteristics of GaAs/Al0.3Ga0.7As heterostructure diodes and heterojunction bipolar transistors (HBTs) passivated by various Si-based thin films, i.e. amorphous Si, SiC, as well as the conventional SiOx and SiNx, were investigated and compared. All these films were found effective in reducing the leakage current and long term degradation. Less size-dependent on the current gain for the passivated HBTs by amorphous Si and SiC was observed. In addition, the devices passivated by amorphous Si and SiC films exhibited more stable characteristics during high power operation, which were indicated by the unchanged junction voltage in the diodes and the stable microwave performance in the HBTs. These de and thermal properties of the passivated devices demonstrate the potential of SiC and amorphous Si as excellent passivation materials for power devices.
    Appears in Collections:[電機工程研究所] 期刊論文

    Files in This Item:

    File Description SizeFormat

    All items in NCUIR are protected by copyright, with all rights reserved.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback  - 隱私權政策聲明