中大機構典藏-NCU Institutional Repository-提供博碩士論文、考古題、期刊論文、研究計畫等下載:Item 987654321/32626
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 80990/80990 (100%)
Visitors : 42952343      Online Users : 1034
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/32626


    Title: Quantum-confined Stark shift in electroreflectance of InAs/InxGa1-xAs self-assembled quantum dots
    Authors: Hsu,TM;Chang,WH;Huang,CC;Yeh,NT;Chyi,JI
    Contributors: 電機工程研究所
    Keywords: ELECTRON-HOLE ALIGNMENT;MU-M;DEPENDENCE
    Date: 2001
    Issue Date: 2010-07-06 18:34:30 (UTC+8)
    Publisher: 中央大學
    Abstract: Electroreflectance was employed to study the electric-field effect on the interband transitions of InAs quantum dots embedded in an In0.16Ga0.84As matrix. The electric field caused an asymmetric quantum-confined Stark shift, which revealed a nonzero built
    Relation: APPLIED PHYSICS LETTERS
    Appears in Collections:[Graduate Institute of Electrical Engineering] journal & Dissertation

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML428View/Open


    All items in NCUIR are protected by copyright, with all rights reserved.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 隱私權政策聲明