中大機構典藏-NCU Institutional Repository-提供博碩士論文、考古題、期刊論文、研究計畫等下載:Item 987654321/51033
English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 80990/80990 (100%)
造访人次 : 41642460      在线人数 : 1387
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻


    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://ir.lib.ncu.edu.tw/handle/987654321/51033


    题名: Fluorine-doped tin oxide films grown by pulsed direct current magnetron sputtering with an Sn target
    作者: Liao,BH;Kuo,CC;Chen,PJ;Lee,CC
    贡献者: 光電科學與工程學系
    关键词: THIN-FILMS;OPTICAL-PROPERTIES;SB
    日期: 2011
    上传时间: 2012-03-27 18:16:11 (UTC+8)
    出版者: 國立中央大學
    摘要: Fluorine-doped tin oxide (FTO) films have been deposited by pulsed DC magnetron sputtering with an Sn target. Various ratios of CF(4)/O(2) gas were injected to enhance the optical and electrical properties of the films. The extinction coefficient was lower than 1.5 x 10(-3) in the range from 400 to 800 nm when the CF(4)/O(2) ratio was 0.375. The resistivity of fluorine-doped SnO(2) films (1.63 x 10(-3) Omega cm) deposited at 300 degrees C was 27.9 times smaller than that of undoped SnO(2) (4.55 x 10(-2) Omega cm). Finally, an FTO film was consecutively deposited for protecting the oxidation of indium tin oxide films. The resistivity of the double-layered film was 2.68 x 10(-4) Omega cm, which increased by less than 39% at a 450 degrees C annealing temperature for 1 h in air. (C) 2010 Optical Society of America
    關聯: APPLIED OPTICS
    显示于类别:[光電科學與工程學系] 期刊論文

    文件中的档案:

    档案 描述 大小格式浏览次数
    index.html0KbHTML563检视/开启


    在NCUIR中所有的数据项都受到原著作权保护.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 隱私權政策聲明