波前檢測器光源校正演算法;Wavefront Sensor Light Source Calibration Algorithm

Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/95384

Title:	波前檢測器光源校正演算法;Wavefront Sensor Light Source Calibration Algorithm
Authors:	曾仲緯;Tzeng, Zhong-Wei
Contributors:	照明與顯示科技研究所
Keywords:	波前檢測器;光源校正;光線追跡
Date:	2024-08-08
Issue Date:	2024-10-09 16:45:16 (UTC+8)
Publisher:	國立中央大學
Abstract:	隨著 VR產業的高速發展，大型鏡片檢測需求日益增加。然而，市場上的檢測機器往往難以滿足對大型鏡片的全面檢測需求，尤其是要實現高速且精確的量測。為了解決這一問題，本實驗室先前開發一種自動化波前檢測設備，專門應對小型鏡片的大量檢測需求。該設備的優勢在於，單一鏡片的量測週期僅需十秒內即可完成，並且採用非接觸式量測架構，確保在不破壞鏡片的情況下進行量測，即使檢測完畢，鏡片仍可直接用於光學元件上。本研究的目標是解決使用波前檢測器（ Shack-Hartman Wavefront Sensor）量測大型透鏡時所需的昂貴大口徑光源問題。為此，本論文提出使用軟體校正硬體不足的方法，並利用微分光線追跡技術來校正光源的像差，以模擬接近完美的光源。我們從設計離軸拋物面鏡開始，並利用微分光線追跡（ Differential Ray Tracing）進行校正，進一步完善光源系統。這項研究的成果將有助於降低大型光學系統測量成本，同時提高測量的準確性和可靠性。;With the rapid development of the VR industry, the demand for inspecting large lenses is increasing. However, current market inspection machines often struggle to fully and accurately measure large lenses at high speeds. To address this issue, our laboratory previously developed an automated wavefront detection device designed to efficiently handle the high-volume inspection of small lenses. This device offers the advantage of completing a measurement cycle for a single lens in less than ten seconds and employs a non-contact measurement structure, ensuring that the lens remains undamaged and can be directly used in optical components post-inspection. The goal of this research is to address the high cost of large-aperture light sources required for measuring large lenses using a Shack-Hartmann Wavefront Sensor. To achieve this, the paper proposes using software to correct hardware deficiencies and employing differential ray tracing technology to correct the light source aberrations, thereby simulating an almost perfect light source. We start by designing an off-axis parabolic mirror and then use differential ray tracing to make the necessary corrections, further improving the light source system. The results of this study will help reduce the measurement costs of large optical systems while enhancing measurement accuracy and reliability.
Appears in Collections:	[Institute of Lighting and Display Science ] Electronic Thesis & Dissertation

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