A local parallel search approach for memory failure pattern identification

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題名:	A local parallel search approach for memory failure pattern identification
作者:	鄭政誠;Lin, Bing-Yang;Wu, Cheng-Wen;Lee, Mincent;Lin, Hung-Chih;Peng, Ching-Nen;Wang, Min-Jer
貢獻者:	文學院歷史研究所
關鍵詞:	Amnesia;Arrays;CMOS;Data mining;Design engineering;Failure;Failure analysis;failure pattern identification;Inspection;Logic circuits;Manuals;memory diagnosis;Memory management;memory testing;Sparse matrices;Tasks;yield improvement
日期:	2016-03-01
上傳時間:	2026-04-23 14:51:35 (UTC+8)
出版者:	IEEE Computer Society;New York: IEEE
摘要:	摘要： Due to more aggressive design rules adopted by memories than logic circuits, memories have been considered as the major technology driver of advanced logic circuits, so far as CMOS process technology is concerned. Memory failure pattern identification therefore is important, and is traditionally considered a key task that can help improve the efficiency of memory diagnosis and failure analysis. Critical failure patterns (that are the yield killers), however, may change in different memory designs and process technologies. It is difficult to identify critical failure patterns from high-volume memory failure bitmaps if they are not predefined. To solve this problem, we propose a local parallel search algorithm for efficient memory failure pattern identification. In addition, the proposed system integrates the defect-spectrum-based and coordinate-distance-based methods to identify critical memory failure patterns from a large amount of memory failure bitmaps automatically, even if they are not defined in advance. In our experiment for 132,488 4-MB memory failure bitmaps, the proposed system can automatically identify six critical yet undefined failure patterns in minutes, in addition to all known patterns. In comparison, the state-of-the-art commercial tools need manual inspection of the memory failure bitmaps to identify the same failure patterns. 其他題名： TC 出版者： New York: IEEE 出版日期： 2016-03-01 出處： IEEE transactions on computers, 2016-03, Vol.65 (3), p.770-780 資源來源： IEEE Electronic Library (IEL) 版權： Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2016 識別號： ISSN: 0018-9340 識別號： EISSN: 1557-9956 識別號： DOI: 10.1109/TC.2015.2462820 識別號： CODEN: ITCOB4
顯示於類別:	[歷史研究所] 期刊論文

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