鄰近類別 研究計畫 [41/41] 博碩士論文 [278/278] 考古題 [35/35] 類別統計 近3年內發表的文件: 0(0.00%) 含全文筆數: 18(100.00%) 文件下載次數統計 下載大於0次: 18(100.00%) 下載大於100次: 3(16.67%) 檔案下載總次數: 3516(0.82%) 最後更新時間: 2026-06-19 23:54 上傳排行 資料載入中..... 下載排行 資料載入中..... 最近上傳 清初漢文人心態的轉變及其對詩詞風氣的影響－以康熙十八年（1679）博學... Write current self-configuration sc... RRAM defect modeling and failure an... Reactivation of spares for off-chip... On improving interconnect defect di... Low-cost post-bond testing of 3-D I... Low-cost error tolerance scheme for... In-situ method for TSV delay testin... Generalization of an enhanced ECC m... DArT: A component-based DRAM area, ...

跳至: (選擇年份) 2026 2025 2024 2023 2022 2021 2020 2019 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 2008 2007 2006 2005 2004 2003 2002 2001 2000 1999 1998 1997 1996 1995 1994 1993 1992 1991 1990 1985 1980 1975 1970 1960 1950 (選擇月份) January February March April May June July August September October November December 或輸入年份:

由新到舊排序 由最舊的開始

顯示項目1-18 / 18. (共1頁) 1  每頁顯示[10|25|50]項目

日期	題名	作者
2016-09-01	清初漢文人心態的轉變及其對詩詞風氣的影響－以康熙十八年（1679）博學鴻儒科為考察中心	王力堅; Lijian), 王力堅(WANG
2016-04-01	Configurable Cubical Redundancy Schemes for Channel-Based 3-D DRAM Yield Improvement	鄭政誠; Lin, Bing-Yang; Chiang, Wan-Ting; Wu, Cheng-Wen; Lee, Mincent; Lin, Hung-Chih; Peng, Ching-Nen; Wang, Min-Jer
2016-03-01	A local parallel search approach for memory failure pattern identification	鄭政誠; Lin, Bing-Yang; Wu, Cheng-Wen; Lee, Mincent; Lin, Hung-Chih; Peng, Ching-Nen; Wang, Min-Jer
2015-01-01	RRAM defect modeling and failure analysis based on march test and a novel squeeze-search scheme	鄭政誠; Chen, Ching-Yi; Shih, Hsiu-Chuan; Wu, Cheng-Wen; Lin, Chih-He; Chiu, Pi-Feng; Sheu, Shyh-Shyuan; Chen, Frederick T.
2014-11-01	Low-cost post-bond testing of 3-D ICs containing a passive silicon interposer base	鄭政誠; Chi, Chun-Chuan; Marinissen, Erik Jan; Goel, Sandeep Kumar; Wu, Cheng-Wen
2014-02-01	Application-independent testing of 3-D field programmable gate array interconnect faults	鄭政誠; Peng, Yen-Lin; Kwai, Ding-Ming; Chou, Yung-Fa; Wu, Cheng-Wen
2014-01-01	DArT: A component-based DRAM area, power, and timing modeling tool	鄭政誠; Shih, Hsiu-Chuan; Luo, Pei-Wen; Yeh, Jen-Chieh; Lin, Shu-Yen; Kwai, Ding-Ming; Lu, Shih-Lien; Schaefer, Andre; Wu, Cheng-Wen
2014-01-01	On improving interconnect defect diagnosis resolution and yield for interposer-based 3-D ICs	鄭政誠; Chi, Chun-Chuan; Lin, Bing-Yang; Wu, Cheng-Wen; Wang, Min-Jer; Lin, Hung-Chih; Peng, Ching-Neng
2013-06-05	Generalization of an enhanced ECC methodology for low power PSRAM	鄭政誠; Chen, Po-Yuan; Su, Chin-Lung; Chen, Chao-Hsun; Wu, Cheng-Wen
2013-01-01	Write current self-configuration scheme for MRAM yield improvement	鄭政誠; Chen, Ching-Yi; Wang, Sheng-Hung; Wu, Cheng-Wen
2013-01-01	AC-plus scan methodology for small delay testing and characterization	鄭政誠; Li, Tsung-Yeh; Huang, Shi-Yu; Hsu, Hsuan-Jung; Tzeng, Chao-Wen; Huang, Chih-Tsun; Liou, Jing-Jia; Ma, Hsi-Pin; Huang, Po-Chiun; Bor, Jenn-Chyou; Tien, Ching-Cheng; Wang, Chih-Hu; Wu, Cheng-Wen
2013-01-01	In-situ method for TSV delay testing and characterization using input sensitivity analysis	鄭政誠; You, Jhih-Wei; Huang, Shi-Yu; Lin, Yu-Hsiang; Tsai, Meng-Hsiu; Kwai, Ding-Ming; Chou, Yung-Fa; Wu, Cheng-Wen
2013-01-01	Low-cost error tolerance scheme for 3-D CMOS imagers	鄭政誠; Chang, Hsiu-Ming Chang; Huang, Jiun-Lang; Kwai, Ding-Ming; Cheng, Kwang-Ting; Wu, Cheng-Wen
2013-01-01	Reactivation of spares for off-chip memory repair after die stacking in a 3-D IC with TSVs	鄭政誠; Chou, Yung-Fa; Kwai, Ding-Ming; Shieh, Ming-Der; Wu, Cheng-Wen
2012-11-01	A study on electric properties for pulse laser annealing of ITO film after wet etching	鄭政誠; Lee, C.J.; Lin, H.K.; Li, C.H.; Chen, L.X.; Lee, C.C.; Wu, C.W.; Huang, J.C.
2010	Jesus in Beijing: How Christianity is Transforming China and Changing the Global Balance of Power	Wang,PCM
2009	Revisiting US-China Wartime Relations: a study of Wedemeyer's China mission	Wang,PCM
1987	COMMUNIST-CHINA AND RELIGION - WANG,HW	TSAI,KY

顯示項目1-18 / 18. (共1頁) 1  每頁顯示[10|25|50]項目