本研究提出了一種瞬時量測波片相位延遲量及波片快軸方位角量測技術，用於精確測量波片相位延遲量與快軸方位角。該技術能有效提升相位延遲量的量測精度與速度，以及快軸方位角的量測精度。波片的相位延遲量與快軸方位角是決定波片效能的兩項關鍵參數，因此，精確量測這兩項參數對於光學系統至關重要。 本技術基於偏振元件與偏振相機組成的偏振干涉術，可一次偵測四個偏振方向的光強度訊號。透過偏振干涉解相法，將偏振相機擷取的光強度訊號轉換為相位差曲線，並利用相位差曲線斜率極大值對應旋轉平台的位置，確定波片的快軸方位角。 本研究所使用的量測系統透過偏振相機實現偏振干涉解相法，能同時擷取四個偏振方向的光強度訊號，避免了傳統方法中需要拍攝多張干涉圖像和使用複雜分光架構的問題，大幅減少了系統體積與複雜性。此外，偏振相機能擷取光強度的二維影像，透過對影像進行空間濾波，有效降低電子雜訊干擾，進而獲得受雜訊影響較小的光強度值。本技術藉由一次偵測四個偏振方向的光強度，瞬間計算出相位延遲量，以及透過相位差曲線量測波片的快軸方位角。 實驗結果表明，該系統能在快軸處於任意角度的情況下準確計算波片的相位延遲量Γ，其相位延遲量的量測解析度可達 0.14°，快軸方位角的量測解析度可達0.004"。。最後，本研究評估了各項誤差來源對量測結果的影響，並提出校正方法以進一步提升系統性能。 ;This study proposes an instantaneous measurement technique for determining the phase retardation and fast-axis orientation of wave plates, aimed at achieving high precision in these measurements. The technique significantly improves the accuracy and speed of phase retardation measurement and enhances the precision of fast-axis orientation determination. Since phase retardation and fast-axis orientation are two critical parameters that define the performance of wave plates, accurately measuring them is crucial for optical systems. The proposed method is based on polarization interferometry using polarization components and a polarization camera, which simultaneously detects light intensity signals in four polarization directions. By applying a polarization interference phase extraction method, the light intensity signals captured by the polarization camera are transformed into phase difference curves. The fast-axis orientation of the wave plate is then determined by identifying the position of the rotation platform corresponding to the extreme slopes of the phase difference curve. The measurement system developed in this study utilizes a polarization camera to perform polarization interference phase extraction, enabling simultaneous acquisition of light intensity signals in four polarization directions. This eliminates the need for capturing multiple interference images and employing complex beam-splitting structures, as required by traditional methods, thereby significantly reducing the system′s size and complexity. Moreover, the polarization camera captures two-dimensional light intensity images, which can be processed with spatial filtering to effectively reduce electronic noise interference, resulting in more accurate light intensity values with minimal noise influence. By detecting light intensity in four polarization directions at once, this technique instantaneously calculates the phase retardation and measures the fast-axis orientation of the wave plate through the phase difference curve. Experimental results demonstrate that the proposed system accurately calculates the phase retardation Γ of wave plates under arbitrary fast-axis angles, achieving a phase retardation measurement resolution of 0.14° and a fast-axis orientation measurement resolution of 0.004 ". Lastly, this study evaluates the impact of various error sources on the measurement results and proposes correction methods to further enhance the system′s performance.
