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Items for Author "Li,JF"
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Showing 16 items.
Collection
Date
Title
Authors
Bitstream
[電機工程學系] 期刊論文
2010
A Built-in Method to Repair SoC RAMs in Parallel
Tseng,TW
;
Li,JF
;
Hou,CS
[電機工程研究所] 期刊論文
2005
A built-in self-repair design for RAMs with 2-D redundancy
Li,JF
;
Yeh,JC
;
Huang,RF
;
Wu,CW
[電機工程研究所] 期刊論文
2002
A hierarchical test methodology for systems on chip
Li,JF
;
Huang,HJ
;
Chen,JB
;
Su,CP
;
Wu,CW
;
Cheng,C
;
Chen,SI
;
Hwang,CY
;
Lin,HP
[電機工程學系] 期刊論文
2011
A Low-Cost Built-In Redundancy-Analysis Scheme for Word-Oriented RAMs With 2-D Redundancy
Tseng,TW
;
Li,JF
[電機工程研究所] 期刊論文
2003
Built-in redundancy analysis for memory yield improvement
Huang,CT
;
Wu,CF
;
Li,JF
;
Wu,CW
[電機工程學系] 期刊論文
2010
DABISR: A Defect-Aware Built-In Self-Repair Scheme for Single/Multi-Port RAMs in SoCs
Tseng,TW
;
Huang,YJ
;
Li,JF
[電機工程研究所] 期刊論文
2004
Diagnosing binary content addressable memories with comparison and RAM faults
Li,JF
[電機工程研究所] 期刊論文
2004
Efficient block-level connectivity verification algorithms for embedded memories
Li,JF
[土木工程研究所] 期刊論文
2004
Evaluation of asymptotic stress field around a crack tip for Neo-Hookean hyperelastic materials
Chang,JH
;
Li,JF
[電機工程學系] 期刊論文
2011
Memory Built-In Self-Repair Planning Framework for RAMs in SoCs
Hou,CS
;
Li,JF
;
Tseng,TW
[電機工程學系] 期刊論文
2010
ReBISR: A Reconfigurable Built-In Self-Repair Scheme for Random Access Memories in SOCs
Tseng,TW
;
Li,JF
;
Hsu,CC
[電機工程學系] 期刊論文
2010
Reliability-Enhancement and Self-Repair Schemes for SRAMs With Static and Dynamic Faults
Li,JF
;
Tseng,TW
;
Hou,CS
[電機工程學系] 期刊論文
2011
SETBIST: An Soft-Error Tolerant Built-In Self-Test Scheme for Random Access Memories
Tseng,TW
;
Li,JF
[電機工程研究所] 期刊論文
2003
Testing and diagnosis methodologies for embedded content addressable memories
Li,JF
;
Tzeng,RS
;
Wu,CW
[電機工程學系] 期刊論文
2010
Testing Comparison and Delay Faults of TCAMs With Asymmetric Cells
Li,JF
[電機工程學系] 期刊論文
2010
Testing Random Defect and Process Variation Induced Comparison Faults of TCAMs with Asymmetric Cells
Li,JF
;
Huang,YJ
;
Hu,YJ
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