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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/29627


    Title: CRITICAL TIME OF THE LOGNORMAL-DISTRIBUTION
    Authors: CHANG,DS
    Contributors: 企業管理研究所
    Date: 1994
    Issue Date: 2010-06-29 20:33:22 (UTC+8)
    Publisher: 中央大學
    Abstract: The critical time is the time point as the failure rate starts to decrease and also as the mean residual lifetime starts to increase1. The estimated critical time is useful for determining the duration of a burn-in process. The method for estimating the critical time of the failure rate for lognormal lifetime distribution is discussed. A single time censored data is used as a example for illustration.
    Relation: MICROELECTRONICS AND RELIABILITY
    Appears in Collections:[企業管理研究所] 期刊論文

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