English  |  正體中文  |  简体中文  |  Items with full text/Total items : 68069/68069 (100%)
Visitors : 23168833      Online Users : 203
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/29633


    Title: ANALYSIS OF ACCELERATED DEGRADATION DATA IN A 2-WAY DESIGN
    Authors: CHANG,DS
    Contributors: 企業管理研究所
    Date: 1993
    Issue Date: 2010-06-29 20:33:30 (UTC+8)
    Publisher: 中央大學
    Abstract: In this paper a generalized Eyring model is used to describe the dependence of performance, aging and accelerated stresses in a power supply. The tests considered here involve multiple measurements collected by automatic monitor system in a two-way design. The expected time to failure of a power supply at the use condition is estimated.
    Relation: RELIABILITY ENGINEERING & SYSTEM SAFETY
    Appears in Collections:[企業管理研究所] 期刊論文

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML490View/Open


    All items in NCUIR are protected by copyright, with all rights reserved.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback  - 隱私權政策聲明