中大機構典藏-NCU Institutional Repository-提供博碩士論文、考古題、期刊論文、研究計畫等下載:Item 987654321/29637
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 80990/80990 (100%)
Visitors : 41639521      Online Users : 1291
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/29637


    Title: SELECTING THE MOST RELIABLE DESIGN UNDER TYPE-II CENSORED ACCELERATED TESTING
    Authors: CHANG,DS;HUANG,DY;TSENG,ST
    Contributors: 企業管理研究所
    Keywords: WEIBULL POPULATIONS
    Date: 1992
    Issue Date: 2010-06-29 20:33:37 (UTC+8)
    Publisher: 中央大學
    Abstract: Accelerated life tests (ALTs) of products and materials are used to obtain reliability information within a reasonable time frame. However, there are no suitable selection rules for selecting the best product or material as a result of the ALT. Under the type-II censoring plan, this paper proposes a reasonable selection rule for an ALT using the Arrhenius model. The advantages of this selection rule are compared with a non-ALT selection rule by using as criteria, a) the average ratio of time-saving in life testing, and b) sample size. The tradeoff between an increased sample size and a shortened life testing time for the ALT selection procedure is feasible.
    Relation: IEEE TRANSACTIONS ON RELIABILITY
    Appears in Collections:[Graduate Institute of Business Administration] journal & Dissertation

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML561View/Open


    All items in NCUIR are protected by copyright, with all rights reserved.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 隱私權政策聲明