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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/32089


    Title: Performance consideration of MOS and junction diodes for varactor application
    Authors: Chan,Yi-Jen;Huang,Chi-Feng;Wu,Chun-Chieh;Chen,Chun-Hon;Chao,Chih-Ping
    Contributors: 電機工程研究所
    Keywords: PHASE NOISE;CMOS;DESIGN;VCOS
    Date: 2007
    Issue Date: 2010-07-06 18:18:22 (UTC+8)
    Publisher: 中央大學
    Abstract: The engineering and tradeoffs for quality factor, capacitance tuning ratio, capacitance mismatch, and low-frequency noise for different varactor device structures, geometry sizes, and operations have been compared to provide a comprehensive guideline of a
    Relation: IEEE TRANSACTIONS ON ELECTRON DEVICES
    Appears in Collections:[電機工程研究所] 期刊論文

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