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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/32633


    Title: Surface photovoltage spectroscopy characterization of a GaAs/GaAlAs vertical-cavity-surface-emitting-laser structure: Angle dependence
    Authors: Liang,JS;Huang,YS;Tien,CW;Chang,YM;Chen,CW;Li,NY;Li,PW;Pollak,FH
    Contributors: 電機工程研究所
    Keywords: PHOTOMODULATED REFLECTANCE;PHOTOREFLECTANCE
    Date: 2001
    Issue Date: 2010-07-06 18:34:46 (UTC+8)
    Publisher: 中央大學
    Abstract: An angle-dependent surface photovoltage spectroscopy (SPS) study has been performed at room temperature on a GaAs/GaAlAs-based vertical-cavity-surface-emitting-laser (VCSEL) structure emitting at a wavelength near 850 nm. For comparison purposes, we have
    Relation: APPLIED PHYSICS LETTERS
    Appears in Collections:[電機工程研究所] 期刊論文

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