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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/32641

    Title: A behavior-level fault model for the closed-loop operational amplifier
    Authors: Chang,YJ;Lee,CL;Chen,JE;Su,CC
    Contributors: 電機工程研究所
    Keywords: ANALOG
    Date: 2000
    Issue Date: 2010-07-06 18:35:04 (UTC+8)
    Publisher: 中央大學
    Abstract: In this paper, a simple behavior-level fault model, which is able to represent the faulty behavior of the closed-loop operational amplifier (OP), is presented. The fault model, derived from the macro equivalent circuit of the OP but verified with transist
    Appears in Collections:[電機工程研究所] 期刊論文

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