English  |  正體中文  |  简体中文  |  Items with full text/Total items : 78852/78852 (100%)
Visitors : 36038487      Online Users : 727
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version

    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/7322

    Title: 低溫成長氮化鎵薄膜之特性研究;Material Characterizations of Low temperature grown GaN films
    Authors: 陳松昇;song-sang chen
    Contributors: 物理研究所
    Keywords: 低溫成長的氮化鎵;LT-GaN
    Date: 2003-07-10
    Issue Date: 2009-09-22 10:55:14 (UTC+8)
    Publisher: 國立中央大學圖書館
    Abstract: 本篇論文是研究低溫成長氮化鎵之材料特性:包括以霍爾量測法檢視其電性;以光激發光及吸收光譜檢視其光性: 以X光繞射法檢視其晶體結構。並以原子力顯微鏡量測的結果作其在電性、光性及內部結構之佐證。另外並以高溫爐或是快速熱退火改變試片之熱處理條件,或以離子佈植的方式改變試片原有之特性。 This issue is discovered the material characterizations of low temperature growth GaN films:including electricity,optical properties,structure.
    Appears in Collections:[物理研究所] 博碩士論文

    Files in This Item:

    File SizeFormat

    All items in NCUIR are protected by copyright, with all rights reserved.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 隱私權政策聲明