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    顯示項目476-491 / 491. (共20頁)
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    日期題名作者
    2000 Nonalloyed GaAs metal-semiconductor field effect transistor Lee,CT; Huang,JH; Tsai,CD
    2000 Novel measurement method for fiber optical cable television echo rating baseband parameter at subscriber Lu,HH; Lee,CT
    2000 Observation of less heat generation and investigation of its effect on the stability range of a Nd : YAG laser Cheng,CC; Huang,TL; Chang,SH; Tsai,HS; Liu,HP
    2000 Ohmic performance comparison for Ti/Ni/Au and Ti/Pt/Au on InAs/graded InGaAs/GaAs layers Lyu,YT; Jaw,KL; Lee,CT; Tsai,CD; Lin,YJ; Cherng,YT
    2000 Ophthalmic lens design with the optimization of the aspherical coefficients Sun,WS; Tien,CL; Sun,CC; Chang,MW; Chang,H
    2000 Ordinary polarized phase conjugator using the photovoltaic effect Yau,HF; Kung,HC; Lee,HY; Sun,CC; Chen,TC; Chang,CC; Tong,YP; Chen,J
    2000 Passivation mechanism analysis of sulfur-passivated InGaP surfaces using x-ray photoelectron spectroscopy Tsai,CD; Lee,CT
    2000 Passive Q-switch and mode-locking modulators for Nd : hosted lasers Chen,JW; Yau,HF; Liu,HP; Chen,TC; Cheng,CC; Liu,FM
    2000 Passive Q-switches for Nd : hosted solid state lasers Chen,JW; Kung,HC; Yu,HF; Liu,HP; Chen,TC; Cheng,CC
    2000 Polarization properties and frequency stabilization of an internal-mirror 1523 nm He-Ne laser under axial magnetic field Huang,TL; Shy,JT; Lin,T; Liu,HP
    2000 Shift-tolerance property of an optical double-random phase-encoding encryption system Wang,B; Sun,CC; Su,WC; Chiou,AET
    2000 Simultaneous determination of the thermal expansion coefficient and the elastic modulus of Ta2O5 thin film using phase shifting interferometry Tien,CL; Jaing,CC; Lee,CC; Chuang,KP
    2000 Sub-Doppler spectroscopy of molecular iodine at 531 nm using a frequency-doubled alpha-distributed feedback laser Huang,TL; Cheng,WY; Lin,YR; Shy,JT; Liu,HP
    2000 Systematic synthesis of R-L and C-D immittances using single CCIII Wang,HY; Lee,CT
    2000 The measurement of thin film stress using phase shifting interferometry Tien,CL; Lee,CC; Jaing,CC
    2000 X-ray photoelectron spectroscopy study of (NH4)(2)S-x-treated Mg-doped GaN layers Lin,YJ; Tsai,CD; Lyu,YT; Lee,CT

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