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類別	日期	題名	作者
[電機工程學系] 期刊論文	2011	A Low-Cost Built-In Redundancy-Analysis Scheme for Word-Oriented RAMs With 2-D Redundancy	Tseng,TW; Li,JF
[電機工程學系] 期刊論文	2011	Memory Built-In Self-Repair Planning Framework for RAMs in SoCs	Hou,CS; Li,JF; Tseng,TW
[電機工程學系] 期刊論文	2011	SETBIST: An Soft-Error Tolerant Built-In Self-Test Scheme for Random Access Memories	Tseng,TW; Li,JF
[電機工程學系] 期刊論文	2010	A Built-in Method to Repair SoC RAMs in Parallel	Tseng,TW; Li,JF; Hou,CS
[電機工程學系] 期刊論文	2010	DABISR: A Defect-Aware Built-In Self-Repair Scheme for Single/Multi-Port RAMs in SoCs	Tseng,TW; Huang,YJ; Li,JF
[電機工程學系] 期刊論文	2010	ReBISR: A Reconfigurable Built-In Self-Repair Scheme for Random Access Memories in SOCs	Tseng,TW; Li,JF; Hsu,CC
[電機工程學系] 期刊論文	2010	Reliability-Enhancement and Self-Repair Schemes for SRAMs With Static and Dynamic Faults	Li,JF; Tseng,TW; Hou,CS