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    "Li,JF"的相關文件 

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    顯示 16 項.

    類別 日期 題名 作者 檔案
    [土木工程研究所] 期刊論文 2004 Evaluation of asymptotic stress field around a crack tip for Neo-Hookean hyperelastic materials Chang,JH; Li,JF
    [電機工程研究所] 期刊論文 2005 A built-in self-repair design for RAMs with 2-D redundancy Li,JF; Yeh,JC; Huang,RF; Wu,CW
    [電機工程研究所] 期刊論文 2004 Diagnosing binary content addressable memories with comparison and RAM faults Li,JF
    [電機工程研究所] 期刊論文 2004 Efficient block-level connectivity verification algorithms for embedded memories Li,JF
    [電機工程研究所] 期刊論文 2003 Built-in redundancy analysis for memory yield improvement Huang,CT; Wu,CF; Li,JF; Wu,CW
    [電機工程研究所] 期刊論文 2003 Testing and diagnosis methodologies for embedded content addressable memories Li,JF; Tzeng,RS; Wu,CW
    [電機工程研究所] 期刊論文 2002 A hierarchical test methodology for systems on chip Li,JF; Huang,HJ; Chen,JB; Su,CP; Wu,CW; Cheng,C; Chen,SI; Hwang,CY; Lin,HP
    [電機工程學系] 期刊論文 2011 A Low-Cost Built-In Redundancy-Analysis Scheme for Word-Oriented RAMs With 2-D Redundancy Tseng,TW; Li,JF
    [電機工程學系] 期刊論文 2011 Memory Built-In Self-Repair Planning Framework for RAMs in SoCs Hou,CS; Li,JF; Tseng,TW
    [電機工程學系] 期刊論文 2011 SETBIST: An Soft-Error Tolerant Built-In Self-Test Scheme for Random Access Memories Tseng,TW; Li,JF
    [電機工程學系] 期刊論文 2010 A Built-in Method to Repair SoC RAMs in Parallel Tseng,TW; Li,JF; Hou,CS
    [電機工程學系] 期刊論文 2010 DABISR: A Defect-Aware Built-In Self-Repair Scheme for Single/Multi-Port RAMs in SoCs Tseng,TW; Huang,YJ; Li,JF
    [電機工程學系] 期刊論文 2010 ReBISR: A Reconfigurable Built-In Self-Repair Scheme for Random Access Memories in SOCs Tseng,TW; Li,JF; Hsu,CC
    [電機工程學系] 期刊論文 2010 Reliability-Enhancement and Self-Repair Schemes for SRAMs With Static and Dynamic Faults Li,JF; Tseng,TW; Hou,CS
    [電機工程學系] 期刊論文 2010 Testing Comparison and Delay Faults of TCAMs With Asymmetric Cells Li,JF
    [電機工程學系] 期刊論文 2010 Testing Random Defect and Process Variation Induced Comparison Faults of TCAMs with Asymmetric Cells Li,JF; Huang,YJ; Hu,YJ

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