English  |  正體中文  |  简体中文  |  Items with full text/Total items : 66984/66984 (100%)
Visitors : 23166928      Online Users : 452
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version

    Category

    Loading community tree, please wait....

    Year

    Loading year class tree, please wait....

    Items for Author "Li,JF" 

    Return to Browse by Author

    Showing 16 items.

    Collection Date Title Authors Bitstream
    [土木工程研究所] 期刊論文 2004 Evaluation of asymptotic stress field around a crack tip for Neo-Hookean hyperelastic materials Chang,JH; Li,JF
    [電機工程學系] 期刊論文 2011 A Low-Cost Built-In Redundancy-Analysis Scheme for Word-Oriented RAMs With 2-D Redundancy Tseng,TW; Li,JF
    [電機工程學系] 期刊論文 2011 Memory Built-In Self-Repair Planning Framework for RAMs in SoCs Hou,CS; Li,JF; Tseng,TW
    [電機工程學系] 期刊論文 2011 SETBIST: An Soft-Error Tolerant Built-In Self-Test Scheme for Random Access Memories Tseng,TW; Li,JF
    [電機工程學系] 期刊論文 2010 A Built-in Method to Repair SoC RAMs in Parallel Tseng,TW; Li,JF; Hou,CS
    [電機工程學系] 期刊論文 2010 DABISR: A Defect-Aware Built-In Self-Repair Scheme for Single/Multi-Port RAMs in SoCs Tseng,TW; Huang,YJ; Li,JF
    [電機工程學系] 期刊論文 2010 ReBISR: A Reconfigurable Built-In Self-Repair Scheme for Random Access Memories in SOCs Tseng,TW; Li,JF; Hsu,CC
    [電機工程學系] 期刊論文 2010 Reliability-Enhancement and Self-Repair Schemes for SRAMs With Static and Dynamic Faults Li,JF; Tseng,TW; Hou,CS
    [電機工程學系] 期刊論文 2010 Testing Comparison and Delay Faults of TCAMs With Asymmetric Cells Li,JF
    [電機工程學系] 期刊論文 2010 Testing Random Defect and Process Variation Induced Comparison Faults of TCAMs with Asymmetric Cells Li,JF; Huang,YJ; Hu,YJ
    [電機工程研究所] 期刊論文 2005 A built-in self-repair design for RAMs with 2-D redundancy Li,JF; Yeh,JC; Huang,RF; Wu,CW
    [電機工程研究所] 期刊論文 2004 Diagnosing binary content addressable memories with comparison and RAM faults Li,JF
    [電機工程研究所] 期刊論文 2004 Efficient block-level connectivity verification algorithms for embedded memories Li,JF
    [電機工程研究所] 期刊論文 2003 Built-in redundancy analysis for memory yield improvement Huang,CT; Wu,CF; Li,JF; Wu,CW
    [電機工程研究所] 期刊論文 2003 Testing and diagnosis methodologies for embedded content addressable memories Li,JF; Tzeng,RS; Wu,CW
    [電機工程研究所] 期刊論文 2002 A hierarchical test methodology for systems on chip Li,JF; Huang,HJ; Chen,JB; Su,CP; Wu,CW; Cheng,C; Chen,SI; Hwang,CY; Lin,HP

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback  - 隱私權政策聲明