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    Items for Author "Li, Jin-Fu" 

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    Showing 10 items.

    Collection Date Title Authors Bitstream
    [電機工程學系] 期刊論文 2015-09-01 High repair-efficiency BISR scheme for RAMs by reusing bitmap for bit redundancy 李進福; Hou, Chih-Sheng; Li, Jin-Fu
    [電機工程學系] 期刊論文 2015-07-01 Hierarchical test integration methodology for 3-D ICs 李進福; Chou, Che-Wei; Li, Jin-Fu; Yu, Yun-Chao; Lo, Chih-Yen; Kwai, Ding-Ming; Chou, Yung-Fa
    [電機工程學系] 期刊論文 2014-01-01 A BIST scheme with the ability of diagnostic data compression for RAMs 李進福; Hou, Chih-Sheng; Li, Jin-Fu; Fu, Ting-Jun
    [電機工程學系] 期刊論文 2014-01-01 Testing Disturbance Faults in Various NAND Flash Memories 李進福; Hou, Chih-Sheng; Li, Jin-Fu
    [電機工程學系] 期刊論文 2013-03-25 A built-in self-repair scheme for 3-D RAMs with interdie redundancy 李進福; Chou, Che-Wei; Huang, Yu-Jen; Li, Jin-Fu
    [電機工程學系] 期刊論文 2012-10-16 Testing and diagnosing comparison faults of TCAMs with asymmetric cells 李進福; Li, Jin-Fu
    [電機工程學系] 期刊論文 2012-09-28 Built-in self-repair scheme for the TSVs in 3-D ICs 李進福; Huang, Yu-Jen; Li, Jin-Fu
    [電機工程學系] 期刊論文 2012-05-29 Cost-efficient built-In redundancy analysis with optimal repair rate for RAMs 李進福; Chen, Ting-Ju; Li, Jin-Fu; Tseng, Tsu-Wei
    [電機工程學系] 期刊論文 2012-01-01 A low-power ternary content addressable memory with Pai-Sigma matchlines 李進福; Yang, Shun-Hsun; Huang, Yu-Jen; Li, Jin-Fu
    [電機工程學系] 期刊論文 2012-01-01 Low-cost self-test techniques for small RAMs in SOCs using enhanced IEEE 1500 test wrappers 李進福; Huang, Yu-Jen; Li, Jin-Fu

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