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    日期題名作者
    2002 Low alkaline contamination bilayer bottom antireflective coatings in F-2 excimer laser lithography Chen,HL; Chuang,YF; Lee,CC; Ko,FH; Hsieh,CI; Huang,TY
    2005 Improvement of the optical coating process by cutting layers with sensitive monitor wavelengths Lee,CC; Wu,K; Kuo,CC; Chen,SH
    2005 Influence of thermal annealing and ultraviolet light irradiation on LaF3 thin films at 193 nm Lee,CC; Liu,MC; Kaneko,M; Nakahira,K; Takano,Y
    2005 Microstructure related properties of lanthanum fluoride films deposited by molybdenum boat evaporation at 193 nm Liu,MC; Lee,CC; Kaneko,M; Nakahira,K; Takano,Y
    2006 Chirped-cavity dispersion-compensation filter design Ya-Ping Li,Sheng-Hui Chen,Cheng-Chung Lee
    2006 DC magnetron sputtering of Si to form SiO2 in low-energy ion beam Cheng-Chung Lee,Der-Jun Jan
    2006 Effect of the working gas of the ion-assisted source on the optical and mechanical properties of SiO2 films deposited by dual ion beam sputtering with Si and SiO2 as the starting materials Jean-Yee Wu ,Cheng-Chung Lee
    2006 Effects of ion assistance and substrate temperature on optical characteristics and microstructure of MgF2 films formed by electron-beam evaporation Cheng-Chung Jaing,Ming-Hua Shiao,Cheng-Chung Lee,Chih-Jung Lu,Ming-Chung Liu,Chin-Han Lee,Hsi-Chao Chen
    2006 Effects of temperature on columnar microstructure and recrystallization of TiO2 film produced by ion-assisted deposition Chen HC,Lee CC,Jaing CC,Shiao MH,Lu CJ,Shieu FS.
    2006 How the monitoring curve is affected by the thermal shift of a filter during deposition Sheng-Hui Chen,Cheng-Chung Lee,Chien-Cheng Kuo
    2006 Improving the illumination efficiency and color temperature for a projection system by depositing thin-film coatings on an x-cube prism Chen,Hsi-Chao; Lee,Cheng-Chung; Huang,June-jei
    2006 Influence of monitor passband width on the layer thickness determination during deposition of a dense-wavelength-division-multiplexing filter Cheng-Chung Lee,Chien-Cheng Kuo,Sheng-Hui Chen
    2006 Investigation of thermal annealing of optical properties and residual stress of ion-beam-assisted TiO2 thin films with different substrate temperatures Cheng-Chung Lee,Hsi-Chao Chen,Cheng-Chung Jaing
    2006 Making optical low-pass spatial filters by thin-film phase grating Chen,Sheng-Hui; Zou,Yong-Tong; Lee,Cheng-Chung
    2006 Microstructure- and composition-related characteristics of LaF3 thin films at 193 nm Liu,Ming-Chung; Lee,Cheng-Chung; Kaneko,Masaaki; Nakahira,Kazuhide; Takano,Yuuichi
    2006 Microstructure of magnesium fluoride films deposited by boat evaporation at 193 nm Liu,Ming-Chung; Lee,Cheng-Chung; Kaneko,Masaaki; Nakahira,Kazuhide; Takano,Yuuichi
    2006 Microstructure-related properties at 193 nm of MgF2 and GdF3 films deposited by a resistive-heating boat Ming-Chung Liu,Cheng-Chung Lee,Masaaki Kaneko,Kazuhide Nakahira,Yuuichi Takano
    2006 Rugate filter made with composite thin films by ion-beam sputtering Lee Cheng-Chung,Tang Chien-Jen,Wu Jean-Yee
    2006 TiO2-Ta2O5 composite thin films deposited by radio frequency ion-beam sputtering Lee,Cheng-Chung; Tang,Chien-Jen
    2006 X-ray photoelectron spectroscopy study of thin TiO2 films cosputtered with Al Jin-Cherng Hsu,Paul W. Wang,Cheng-Chung Lee
    2006 All-fiber Mach-Zehnder interferometer for DWDM filter direct group-delay measurement Li,Ya-Ping; Lee,Cheng-Chung
    2007 AlF3 thin films deposited by reactive magnetron sputtering with Al target Lee,Cheng-Chung; Liao,Bo-Huei; Liu,Ming-Chung
    2007 In situ sensitive optical monitoring with proper error compensation Lee,Cheng-Chung; Wu,Kai
    2007 Optical monitoring and real time admittance loci calculation through polarization interferometer Lee,Cheng-Chung; Wu,Kai; Chen,Sheng-Hui; Ma,Sheng-Ju
    2007 Polarization-insensitive dichroic filter for automatic optical inspection of printed circuit boards Li,Ya-Ping; Lee,Cheng-Chung

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